| |
| 2006 | ||
|---|---|---|
| 6 | EE | C.-J. Richard Shi, Michael W. Tian, Guoyong Shi: Efficient DC fault simulation of nonlinear analog circuits: one-step relaxation and adaptive simulation continuation. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1392-1400 (2006) |
| 1999 | ||
| 5 | EE | C.-J. Richard Shi, Michael W. Tian: Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis. ACM Trans. Design Autom. Electr. Syst. 4(3): 280-312 (1999) |
| 1998 | ||
| 4 | C.-J. Richard Shi, Michael W. Tian: Automatic Test Generation for Linear Analog Circuits under Parameter Variations. ASP-DAC 1998: 501-506 | |
| 3 | EE | Michael W. Tian, C.-J. Richard Shi: Efficient DC Fault Simulation of Nonlinear Analog Circuits. DATE 1998: 899-904 |
| 2 | EE | Michael W. Tian, C.-J. Richard Shi: Nonlinear Analog DC Fault Simulation by One-Step Relaxation. VTS 1998: 126-131 |
| 1997 | ||
| 1 | EE | Michael W. Tian, C.-J. Richard Shi: Rapid Frequency-Domain Analog Fault Simulation Under Parameter Tolerances. DAC 1997: 275-280 |
| 1 | C.-J. Richard Shi | [1] [2] [3] [4] [5] [6] |
| 2 | Guoyong Shi | [6] |