| 1998 |
|---|
| 9 | EE | Lakshminarayana Pappu,
Michael L. Bushnell,
Vishwani D. Agrawal,
Mandyam-Komar Srinivas:
Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits.
J. Electronic Testing 12(3): 239-254 (1998) |
| 1997 |
|---|
| 8 | EE | Mandyam-Komar Srinivas,
Michael L. Bushnell,
Vishwani D. Agrawal:
Flags and Algebra for Sequential Circuit VNR Path Delay Fault Test Generation.
VLSI Design 1997: 88-94 |
| 1996 |
|---|
| 7 | EE | Lakshminarayana Pappu,
Michael L. Bushnell,
Vishwani D. Agrawal,
Mandyam-Komar Srinivas:
Statistical path delay fault coverage estimation for synchronous sequential circuits.
VLSI Design 1996: 290-295 |
| 6 | EE | Mandyam-Komar Srinivas,
James Jacob,
Vishwani D. Agrawal:
Functional test generation for synchronous sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 15(7): 831-843 (1996) |
| 1995 |
|---|
| 5 | EE | Mandyam-Komar Srinivas,
Vishwani D. Agrawal,
Michael L. Bushnell:
Functional test generation for path delay faults.
Asian Test Symposium 1995: 339-345 |
| 4 | EE | Mandyam-Komar Srinivas,
James Jacob,
Vishwani D. Agrawal:
Functional test generation for non-scan sequential circuits.
VLSI Design 1995: 47-52 |
| 1994 |
|---|
| 3 | | P. R. Suresh Kumar,
James Jacob,
Mandyam-Komar Srinivas,
Vishwani D. Agrawal:
An Improved Deductive Fault Simulator.
VLSI Design 1994: 307-310 |
| 1993 |
|---|
| 2 | | P. R. Suresh Kumar,
Mandyam-Komar Srinivas,
James Jacob:
Efficient Technique to Reduce Gate Evaluations and Speed Up Fault Simulation.
VLSI Design 1993: 104 |
| 1992 |
|---|
| 1 | | Mandyam-Komar Srinivas,
James Jacob,
Vishwani D. Agrawal:
Finite State Machine Testing Based on Growth and Dissappearance Faults.
FTCS 1992: 238-245 |
