| 2002 |
|---|
| 4 | EE | Jan Pavelka,
Josef Sikula,
Petr Vasina,
Vlasta Sedlakova,
Munecazu Tacano,
Sumihisa Hashiguchi:
Noise and transport characterisation of tantalum capacitors.
Microelectronics Reliability 42(6): 841-847 (2002) |
| 3 | EE | Petr Vasina,
T. Zednicek,
Josef Sikula,
Jan Pavelka:
Failure modes of tantalum capacitors made by different technologies.
Microelectronics Reliability 42(6): 849-854 (2002) |
| 2001 |
|---|
| 2 | EE | P. Schauer,
Josef Sikula,
P. Moravec:
Transport and noise properties of CdTe(Cl) crystals.
Microelectronics Reliability 41(3): 431-436 (2001) |
| 1 | EE | Dubravka Rocak,
Darko Belavic,
Marko Hrovat,
Josef Sikula,
Pavel Koktavy,
Jan Pavelka,
Vlasta Sedlakova:
Low-frequency noise of thick-film resistors as quality and reliability indicator.
Microelectronics Reliability 41(4): 531-542 (2001) |
