| |
| 2001 | ||
|---|---|---|
| 1 | EE | Dubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova: Low-frequency noise of thick-film resistors as quality and reliability indicator. Microelectronics Reliability 41(4): 531-542 (2001) |
| 1 | Darko Belavic | [1] |
| 2 | Marko Hrovat | [1] |
| 3 | Pavel Koktavy | [1] |
| 4 | Jan Pavelka | [1] |
| 5 | Vlasta Sedlakova | [1] |
| 6 | Josef Sikula | [1] |