| |
| 2002 | ||
|---|---|---|
| 1 | EE | Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi: Noise and transport characterisation of tantalum capacitors. Microelectronics Reliability 42(6): 841-847 (2002) |
| 1 | Sumihisa Hashiguchi | [1] |
| 2 | Jan Pavelka | [1] |
| 3 | Vlasta Sedlakova | [1] |
| 4 | Josef Sikula | [1] |
| 5 | Petr Vasina | [1] |