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Pavel Koktavy

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2001
1EEDubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova: Low-frequency noise of thick-film resistors as quality and reliability indicator. Microelectronics Reliability 41(4): 531-542 (2001)

Coauthor Index

1Darko Belavic [1]
2Marko Hrovat [1]
3Jan Pavelka [1]
4Dubravka Rocak [1]
5Vlasta Sedlakova [1]
6Josef Sikula [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)