| |
| 2002 | ||
|---|---|---|
| 2 | EE | Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi: Noise and transport characterisation of tantalum capacitors. Microelectronics Reliability 42(6): 841-847 (2002) |
| 1 | EE | Petr Vasina, T. Zednicek, Josef Sikula, Jan Pavelka: Failure modes of tantalum capacitors made by different technologies. Microelectronics Reliability 42(6): 849-854 (2002) |
| 1 | Sumihisa Hashiguchi | [2] |
| 2 | Jan Pavelka | [1] [2] |
| 3 | Vlasta Sedlakova | [2] |
| 4 | Josef Sikula | [1] [2] |
| 5 | Munecazu Tacano | [2] |
| 6 | T. Zednicek | [1] |