| |
| 2002 | ||
|---|---|---|
| 2 | EE | Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi: Noise and transport characterisation of tantalum capacitors. Microelectronics Reliability 42(6): 841-847 (2002) |
| 2001 | ||
| 1 | EE | Dubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova: Low-frequency noise of thick-film resistors as quality and reliability indicator. Microelectronics Reliability 41(4): 531-542 (2001) |
| 1 | Darko Belavic | [1] |
| 2 | Sumihisa Hashiguchi | [2] |
| 3 | Marko Hrovat | [1] |
| 4 | Pavel Koktavy | [1] |
| 5 | Jan Pavelka | [1] [2] |
| 6 | Dubravka Rocak | [1] |
| 7 | Josef Sikula | [1] [2] |
| 8 | Munecazu Tacano | [2] |
| 9 | Petr Vasina | [2] |