| 2008 |
|---|
| 6 | EE | Seongjae Cho,
Il Han Park,
Jung Hoon Lee,
Jang-Gn Yun,
Doo-Hyun Kim,
Jong Duk Lee,
Hyungcheol Shin,
Byung-Gook Park:
Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI).
IEICE Transactions 91-C(5): 731-735 (2008) |
| 5 | EE | Hochul Lee,
Youngchang Yoon,
Ickhyun Song,
Hyungcheol Shin:
FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs.
IEICE Transactions 91-C(5): 776-779 (2008) |
| 2007 |
|---|
| 4 | EE | Hochul Lee,
Youngchang Yoon,
Seongjae Cho,
Hyungcheol Shin:
Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs.
IEICE Transactions 90-C(5): 968-972 (2007) |
| 3 | EE | Seongjae Cho,
Jang-Gn Yun,
Il Han Park,
Jung Hoon Lee,
Jong Pil Kim,
Jong Duk Lee,
Hyungcheol Shin,
Byung-Gook Park:
Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices.
IEICE Transactions 90-C(5): 988-993 (2007) |
| 2003 |
|---|
| 2 | EE | Minkyu Je,
Jeonghu Han,
Hyungcheol Shin,
Kwyro Lee:
A simple four-terminal small-signal model of RF MOSFETs and its parameter extraction.
Microelectronics Reliability 43(4): 601-609 (2003) |
| 1998 |
|---|
| 1 | EE | Joonho Gil,
Minkyu Je,
Jongho Lee,
Hyungcheol Shin:
A high speed and low power SOL inverter using active body-bias.
ISLPED 1998: 59-63 |
