| |
| 2008 | ||
|---|---|---|
| 2 | EE | Hochul Lee, Youngchang Yoon, Ickhyun Song, Hyungcheol Shin: FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. IEICE Transactions 91-C(5): 776-779 (2008) |
| 2007 | ||
| 1 | EE | Hochul Lee, Youngchang Yoon, Seongjae Cho, Hyungcheol Shin: Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. IEICE Transactions 90-C(5): 968-972 (2007) |
| 1 | Seongjae Cho | [1] |
| 2 | Hyungcheol Shin | [1] [2] |
| 3 | Ickhyun Song | [2] |
| 4 | Youngchang Yoon | [1] [2] |