dblp.uni-trier.dewww.uni-trier.de

Youngchang Yoon

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2008
2EEHochul Lee, Youngchang Yoon, Ickhyun Song, Hyungcheol Shin: FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. IEICE Transactions 91-C(5): 776-779 (2008)
2007
1EEHochul Lee, Youngchang Yoon, Seongjae Cho, Hyungcheol Shin: Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. IEICE Transactions 90-C(5): 968-972 (2007)

Coauthor Index

1Seongjae Cho [1]
2Hochul Lee [1] [2]
3Hyungcheol Shin [1] [2]
4Ickhyun Song [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)