| |
| 2008 | ||
|---|---|---|
| 1 | EE | Hochul Lee, Youngchang Yoon, Ickhyun Song, Hyungcheol Shin: FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. IEICE Transactions 91-C(5): 776-779 (2008) |
| 1 | Hochul Lee | [1] |
| 2 | Hyungcheol Shin | [1] |
| 3 | Youngchang Yoon | [1] |