| 2004 |
|---|
| 6 | EE | You Hongjian,
Yun Shao,
Li Shukai:
Fast rectifying airborne infrared scanning image based on GPS and INS.
Future Generation Comp. Syst. 20(7): 1209-1214 (2004) |
| 2003 |
|---|
| 5 | EE | Yun Shao,
Sudhakar M. Reddy,
Irith Pomeranz,
Seiji Kajihara:
On Selecting Testable Paths in Scan Designs.
J. Electronic Testing 19(4): 447-456 (2003) |
| 2002 |
|---|
| 4 | EE | Yun Shao,
Irith Pomeranz,
Sudhakar M. Reddy:
On Generating High Quality Tests for Transition Faults.
Asian Test Symposium 2002: 1 |
| 3 | EE | Yun Shao,
Irith Pomeranz,
Sudhakar M. Reddy:
Path Delay Fault Test Generation for Standard Scan Designs Using State Tuples.
VLSI Design 2002: 767-772 |
| 2001 |
|---|
| 2 | EE | Yun Shao,
Sudhakar M. Reddy,
Seiji Kajihara,
Irith Pomeranz:
An Efficient Method to Identify Untestable Path Delay Faults.
Asian Test Symposium 2001: 233-238 |
| 1999 |
|---|
| 1 | | Yun Shao,
Ruifeng Guo,
Sudhakar M. Reddy,
Irith Pomeranz:
The effects of test compaction on fault diagnosis.
ITC 1999: 1083-1089 |
