| |
| 2005 | ||
|---|---|---|
| 1 | EE | A. Sibai, S. Lhostis, Y. Rozier, O. Salicio, S. Amtablian, C. Dubois, J. Legrand, J. P. Sénateur, M. Audier, L. Hubert-Pfalzgraff: Characterization of crystalline MOCVD SrTiO3 films on SiO2/Si(100). Microelectronics Reliability 45(5-6): 941-944 (2005) |
| 1 | M. Audier | [1] |
| 2 | C. Dubois | [1] |
| 3 | L. Hubert-Pfalzgraff | [1] |
| 4 | J. Legrand | [1] |
| 5 | S. Lhostis | [1] |
| 6 | Y. Rozier | [1] |
| 7 | O. Salicio | [1] |
| 8 | J. P. Sénateur | [1] |
| 9 | A. Sibai | [1] |