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Walter De Raedt

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2006
6EEJ. Balachandran, Steven Brebels, G. Carchon, T. Webers, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Analysis and modeling of power grid transmission lines. DATE 2006: 33-38
5EEJ. Balachandran, Steven Brebels, G. Carchon, Walter De Raedt, Eric Beyne, M. Kuijk, Bart Nauwelaers: Constant Impedance Scaling Paradigm for Scaling LC transmission lines. ISQED 2006: 387-392
4EEJ. Balachandran, Steven Brebels, G. Carchon, M. Kuijk, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Constant impedance scaling paradigm for interconnect synthesis. SLIP 2006: 99-105
3EEJ. Balachandran, Steven Brebels, G. Carchon, M. Kuijk, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Wafer-level package interconnect options. IEEE Trans. VLSI Syst. 14(6): 654-659 (2006)
2005
2EEJ. Balachandran, Steven Brebels, G. Carchon, T. Webers, Walter De Raedt, Bart Nauwelaers, Eric Beyne: Package level interconnect options. SLIP 2005: 21-27
2003
1EEArun Chandrasekhar, Steven Brebels, Serguei Stoukatch, Eric Beyne, Walter De Raedt, Bart Nauwelaers: The influence of packaging materials on RF performance. Microelectronics Reliability 43(3): 351-357 (2003)

Coauthor Index

1J. Balachandran [2] [3] [4] [5] [6]
2Eric Beyne [1] [2] [3] [4] [5] [6]
3Steven Brebels [1] [2] [3] [4] [5] [6]
4G. Carchon [2] [3] [4] [5] [6]
5Arun Chandrasekhar [1]
6M. Kuijk [3] [4] [5]
7Bart Nauwelaers [1] [2] [3] [4] [5] [6]
8Serguei Stoukatch [1]
9T. Webers [2] [6]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)