| |
| 2003 | ||
|---|---|---|
| 1 | EE | Arun Chandrasekhar, Steven Brebels, Serguei Stoukatch, Eric Beyne, Walter De Raedt, Bart Nauwelaers: The influence of packaging materials on RF performance. Microelectronics Reliability 43(3): 351-357 (2003) |
| 1 | Eric Beyne | [1] |
| 2 | Steven Brebels | [1] |
| 3 | Bart Nauwelaers | [1] |
| 4 | Walter De Raedt | [1] |
| 5 | Serguei Stoukatch | [1] |