| |
| 1998 | ||
|---|---|---|
| 1 | EE | T. M. Mak, Debika Bhattacharya, Cheryl Prunty, Bob Roeder, Nermine Ramadan, Joel Ferguson, Jianlin Yu: Cache RAM inductive fault analysis with fab defect modeling. ITC 1998: 862-871 |
| 1 | Debika Bhattacharya | [1] |
| 2 | Joel Ferguson | [1] |
| 3 | T. M. Mak | [1] |
| 4 | Cheryl Prunty | [1] |
| 5 | Nermine Ramadan | [1] |
| 6 | Bob Roeder | [1] |