| 2008 |
|---|
| 9 | EE | Mohammad Gh. Mohammad,
Kewal K. Saluja:
Testing Flash Memories for Tunnel Oxide Defects.
VLSI Design 2008: 157-162 |
| 2007 |
|---|
| 8 | EE | Mohammad Gh. Mohammad,
Laila Terkawi:
Techniques for Disturb Fault Collapsing.
J. Electronic Testing 23(4): 363-368 (2007) |
| 2006 |
|---|
| 7 | EE | Mohammad Gh. Mohammad,
Laila Terkawi,
Muna Albasman:
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity.
VLSI Design 2006: 100-107 |
| 2005 |
|---|
| 6 | EE | Mohammad Gh. Mohammad,
Kewal K. Saluja:
Optimizing program disturb fault tests using defect-based testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(6): 905-915 (2005) |
| 2003 |
|---|
| 5 | EE | Mohammad Gh. Mohammad,
Kewal K. Saluja:
Stress Test for Disturb Faults in Non-Volatile Memories.
Asian Test Symposium 2003: 384-389 |
| 4 | EE | Mohammad Gh. Mohammad,
Kewal K. Saluja:
Electrical Model For Program Disturb Faults in Non-Volatile Memories.
VLSI Design 2003: 217-222 |
| 2001 |
|---|
| 3 | EE | Mohammad Gh. Mohammad,
Kewal K. Saluja:
Flash Memory Disturbances: Modeling and Test.
VTS 2001: 218-224 |
| 2 | EE | Mohammad Gh. Mohammad,
Kewal K. Saluja,
Alex S. Yap:
Fault Models and Test Procedures for Flash Memory Disturbances.
J. Electronic Testing 17(6): 495-508 (2001) |
| 2000 |
|---|
| 1 | EE | Mohammad Gh. Mohammad,
Kewal K. Saluja,
Alex S. Yap:
Testing Flash Memories.
VLSI Design 2000: 406-411 |
