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Alex S. Yap

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2001
2EEMohammad Gh. Mohammad, Kewal K. Saluja, Alex S. Yap: Fault Models and Test Procedures for Flash Memory Disturbances. J. Electronic Testing 17(6): 495-508 (2001)
2000
1EEMohammad Gh. Mohammad, Kewal K. Saluja, Alex S. Yap: Testing Flash Memories. VLSI Design 2000: 406-411

Coauthor Index

1Mohammad Gh. Mohammad [1] [2]
2Kewal K. Saluja [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)