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E. Miranda

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2005
7EEE. Miranda, B. Brandala: A function-fit model for the hard breakdown I-V characteristics of ultra-thin oxides in MOS structures. Microelectronics Reliability 45(1): 175-178 (2005)
6EEE. Miranda, J. Molina, Y. Kim, H. Iwai: Degradation of high-K LA2O3 gate dielectrics using progressive electrical stress. Microelectronics Reliability 45(9-11): 1365-1369 (2005)
2004
5EEE. Miranda, E. Mallaina: Single-equation model for low and high voltage soft breakdown conduction. Microelectronics Reliability 44(1): 163-166 (2004)
2002
4EEE. Miranda, G. Redin, A. Faigón: Modeling of the I-V characteristics of high-field stressed MOS structures using a Fowler-Nordheim-type tunneling expression. Microelectronics Reliability 42(6): 935-941 (2002)
2000
3EELeonardo Maria Reyneri, Marcello Chiaberge, Luciano Lavagno, Begoña Pino, E. Miranda: Simulink-Based HW/SW Codesign of Embedded Neuro-Fuzzy Systems. Int. J. Neural Syst. 10(3): 211-226 (2000)
1995
2 E. Miranda, Leonardo Maria Reyneri: A CPWM Synapsis for Weighted Radial Basis Functions. IWANN 1995: 830-837
1991
1 Jean Dollimore, E. Miranda, Wang Xu: The Design of a System for Distributing Shared Objects. Comput. J. 34(6): 514-521 (1991)

Coauthor Index

1B. Brandala [7]
2Marcello Chiaberge [3]
3Jean Dollimore [1]
4A. Faigón [4]
5H. Iwai [6]
6Y. Kim [6]
7Luciano Lavagno [3]
8E. Mallaina [5]
9J. Molina [6]
10Begoña Pino [3]
11G. Redin [4]
12Leonardo Maria Reyneri [2] [3]
13Wang Xu [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)