J. Molina
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2005
1
EE
E. Miranda
, J. Molina,
Y. Kim
,
H. Iwai
: Degradation of high-K LA
2
O
3
gate dielectrics using progressive electrical stress.
Microelectronics Reliability 45
(9-11): 1365-1369 (2005)
Coauthor
Index
1
H. Iwai
[
1
]
2
Y. Kim
[
1
]
3
E. Miranda
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
