H. Iwai

List of publications from the DBLP Bibliography Server - FAQ

2005

2 EE E. Miranda, J. Molina, Y. Kim, H. Iwai: Degradation of high-K LA₂O₃ gate dielectrics using progressive electrical stress. Microelectronics Reliability 45(9-11): 1365-1369 (2005)

2002

1 EE H. Iwai, S. Ohmi: Trend of CMOS downsizing and its reliability. Microelectronics Reliability 42(9-11): 1251-1258 (2002)

2005
2	EE	E. Miranda, J. Molina, Y. Kim, H. Iwai: Degradation of high-K LA₂O₃ gate dielectrics using progressive electrical stress. Microelectronics Reliability 45(9-11): 1365-1369 (2005)
2002
1	EE	H. Iwai, S. Ohmi: Trend of CMOS downsizing and its reliability. Microelectronics Reliability 42(9-11): 1251-1258 (2002)

Coauthor Index