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H. Iwai

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2005
2EEE. Miranda, J. Molina, Y. Kim, H. Iwai: Degradation of high-K LA2O3 gate dielectrics using progressive electrical stress. Microelectronics Reliability 45(9-11): 1365-1369 (2005)
2002
1EEH. Iwai, S. Ohmi: Trend of CMOS downsizing and its reliability. Microelectronics Reliability 42(9-11): 1251-1258 (2002)

Coauthor Index

1Y. Kim [2]
2E. Miranda [2]
3J. Molina [2]
4S. Ohmi [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)