B. Brandala
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2005
1
EE
E. Miranda
, B. Brandala: A function-fit model for the hard breakdown I-V characteristics of ultra-thin oxides in MOS structures.
Microelectronics Reliability 45
(1): 175-178 (2005)
Coauthor
Index
1
E. Miranda
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)