| |
| 2002 | ||
|---|---|---|
| 2 | EE | Maria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner: Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectronics Reliability 42(9-11): 1701-1706 (2002) |
| 2001 | ||
| 1 | M. Leicht, G. Fritzer, B. Basnar, S. Golka, J. Smoliner: A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices. Microelectronics Reliability 41(9-10): 1535-1537 (2001) | |
| 1 | B. Basnar | [1] |
| 2 | Marco Buzzo | [2] |
| 3 | Mauro Ciappa | [2] |
| 4 | Wolfgang Fichtner | [2] |
| 5 | G. Fritzer | [1] |
| 6 | S. Golka | [1] |
| 7 | J. Smoliner | [1] |
| 8 | Maria Stangoni | [2] |