| |
| 2006 | ||
|---|---|---|
| 3 | EE | Marco Buzzo, Mauro Ciappa, Wolfgang Fichtner: Characterization of photonic devices by secondary electron potential contrast. Microelectronics Reliability 46(9-11): 1536-1541 (2006) |
| 2005 | ||
| 2 | EE | Marco Buzzo, Mauro Ciappa, Maria Stangoni, Wolfgang Fichtner: Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide Devices by Secondary Electron Potential Contrast. Microelectronics Reliability 45(9-11): 1499-1504 (2005) |
| 2002 | ||
| 1 | EE | Maria Stangoni, Mauro Ciappa, Marco Buzzo, M. Leicht, Wolfgang Fichtner: Simulation and Experimental Validation of Scanning Capacitance Microscopy Measurements across Low-doped Epitaxial PN-Junction. Microelectronics Reliability 42(9-11): 1701-1706 (2002) |
| 1 | Mauro Ciappa | [1] [2] [3] |
| 2 | Wolfgang Fichtner | [1] [2] [3] |
| 3 | M. Leicht | [1] |
| 4 | Maria Stangoni | [1] [2] |