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| 2001 | ||
|---|---|---|
| 1 | M. Leicht, G. Fritzer, B. Basnar, S. Golka, J. Smoliner: A reliable course of Scanning Capacitance Microscopy analysis applied for 2D-Dopant Profilings of Power MOSFET Devices. Microelectronics Reliability 41(9-10): 1535-1537 (2001) | |
| 1 | B. Basnar | [1] |
| 2 | G. Fritzer | [1] |
| 3 | M. Leicht | [1] |
| 4 | J. Smoliner | [1] |