| |
| 2008 | ||
|---|---|---|
| 2 | EE | Suk Joo Bae, Seong-Joon Kim, Man Soo Kim, Bae Jin Lee, Chang Wook Kang: Degradation Analysis of Nano-Contamination in Plasma Display Panels. IEEE Transactions on Reliability 57(2): 222-229 (2008) |
| 2007 | ||
| 1 | EE | Suk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam: Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. IEEE Transactions on Reliability 56(3): 392-400 (2007) |
| 1 | Suk Joo Bae | [1] [2] |
| 2 | Chang Wook Kang | [2] |
| 3 | Man Soo Kim | [2] |
| 4 | Way Kuo | [1] |
| 5 | Paul H. Kvam | [1] |
| 6 | Bae Jin Lee | [2] |