Paul H. Kvam
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2007
1
EE
Suk Joo Bae
,
Seong-Joon Kim
,
Way Kuo
, Paul H. Kvam: Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
IEEE Transactions on Reliability 56
(3): 392-400 (2007)
Coauthor
Index
1
Suk Joo Bae
[
1
]
2
Seong-Joon Kim
[
1
]
3
Way Kuo
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
