| |
| 2009 | ||
|---|---|---|
| 2 | EE | Kyungmee O. Kim, Way Kuo: Optimal burn-in for maximizing reliability of repairable non-series systems. European Journal of Operational Research 193(1): 140-151 (2009) |
| 2004 | ||
| 1 | EE | Kyungmee O. Kim, Way Kuo, Wen Luo: A relation model of gate oxide yield and reliability. Microelectronics Reliability 44(3): 425-434 (2004) |
| 1 | Way Kuo | [1] [2] |
| 2 | Wen Luo | [1] |