Tao Yuan

List of publications from the DBLP Bibliography Server - FAQ

2008

1 EE Tao Yuan, Way Kuo: Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference. European Journal of Operational Research 190(1): 228-240 (2008)

2008
1	EE	Tao Yuan, Way Kuo: Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference. European Journal of Operational Research 190(1): 228-240 (2008)

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