| 2008 |
|---|
| 4 | EE | Suk Joo Bae,
Seong-Joon Kim,
Man Soo Kim,
Bae Jin Lee,
Chang Wook Kang:
Degradation Analysis of Nano-Contamination in Plasma Display Panels.
IEEE Transactions on Reliability 57(2): 222-229 (2008) |
| 2007 |
|---|
| 3 | EE | Furong Tan,
Zhibin Jiang,
Suk Joo Bae:
Generalized Linear Mixed Models for Reliability Analysis of Multi-Copy Repairable Systems.
IEEE Transactions on Reliability 56(1): 106-114 (2007) |
| 2 | EE | Suk Joo Bae,
Seong-Joon Kim,
Way Kuo,
Paul H. Kvam:
Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices.
IEEE Transactions on Reliability 56(3): 392-400 (2007) |
| 2006 |
|---|
| 1 | EE | Gyunghyun Choi,
Suk Joo Bae:
Automated Parameter Selection for Support Vector Machine Decision Tree.
ICONIP (2) 2006: 746-753 |
