| |
| 2006 | ||
|---|---|---|
| 2 | EE | Heinrich Wolf, Horst A. Gieser, Detlef Bonfert, Markus Hauser: ESD Susceptibility of Submicron Air Gaps. Microelectronics Reliability 46(9-11): 1587-1590 (2006) |
| 1 | EE | Detlef Bonfert, Horst A. Gieser, Heinrich Wolf, M. Frank, A. Konrad, J. Schulz: Transient-induced latch-up test setup for wafer-level and package-level. Microelectronics Reliability 46(9-11): 1629-1633 (2006) |
| 1 | M. Frank | [1] |
| 2 | Horst A. Gieser | [1] [2] |
| 3 | Markus Hauser | [2] |
| 4 | A. Konrad | [1] |
| 5 | J. Schulz | [1] |
| 6 | Heinrich Wolf | [1] [2] |