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Chune-Sin Yeh

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2000
3EEYoshiyuki Kawakami, Jingkun Fang, Hirokazu Yonezawa, Nobufusa Iwanishi, Lifeng Wu, Alvin I-Hsien Chen, Norio Koike, Ping Chen, Chune-Sin Yeh, Zhihong Liu: Gate-level aged timing simulation methodology for hot-carrier reliability assurance. ASP-DAC 2000: 289-294
2EELifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami: GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. ISQED 2000: 73-80
1990
1EED. David Forsythe, Atul P. Agarwal, Chune-Sin Yeh, Sheldon Aronowitz, Bhaskar Gadepally: NASFLOW, a Simulation Tool for Silicon Technology Development. DAC 1990: 333-337

Coauthor Index

1Atul P. Agarwal [1]
2Sheldon Aronowitz [1]
3Alvin I-Hsien Chen [2] [3]
4Ping Chen [2] [3]
5Jingkun Fang [2] [3]
6D. David Forsythe [1]
7Bhaskar Gadepally [1]
8Nobufusa Iwanishi [2] [3]
9Yoshiyuki Kawakami [2] [3]
10Norio Koike [2] [3]
11Zhihong Liu [2] [3]
12Yoshifumi Okamoto [2]
13Lifeng Wu [2] [3]
14Heting Yan [2]
15Hirokazu Yonezawa [2] [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)