2000 |
3 | EE | Yoshiyuki Kawakami,
Jingkun Fang,
Hirokazu Yonezawa,
Nobufusa Iwanishi,
Lifeng Wu,
Alvin I-Hsien Chen,
Norio Koike,
Ping Chen,
Chune-Sin Yeh,
Zhihong Liu:
Gate-level aged timing simulation methodology for hot-carrier reliability assurance.
ASP-DAC 2000: 289-294 |
2 | EE | Lifeng Wu,
Jingkun Fang,
Heting Yan,
Ping Chen,
Alvin I-Hsien Chen,
Yoshifumi Okamoto,
Chune-Sin Yeh,
Zhihong Liu,
Nobufusa Iwanishi,
Norio Koike,
Hirokazu Yonezawa,
Yoshiyuki Kawakami:
GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design.
ISQED 2000: 73-80 |
1990 |
1 | EE | D. David Forsythe,
Atul P. Agarwal,
Chune-Sin Yeh,
Sheldon Aronowitz,
Bhaskar Gadepally:
NASFLOW, a Simulation Tool for Silicon Technology Development.
DAC 1990: 333-337 |