Nobufusa Iwanishi

2000
2	EE	Yoshiyuki Kawakami, Jingkun Fang, Hirokazu Yonezawa, Nobufusa Iwanishi, Lifeng Wu, Alvin I-Hsien Chen, Norio Koike, Ping Chen, Chune-Sin Yeh, Zhihong Liu: Gate-level aged timing simulation methodology for hot-carrier reliability assurance. ASP-DAC 2000: 289-294
1	EE	Lifeng Wu, Jingkun Fang, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu, Nobufusa Iwanishi, Norio Koike, Hirokazu Yonezawa, Yoshiyuki Kawakami: GLACIER: A Hot Carrier Gate Level Circuit Characterization and Simulation System for VLSI Design. ISQED 2000: 73-80

Coauthor Index

1	Alvin I-Hsien Chen	[1] [2]
2	Ping Chen	[1] [2]
3	Jingkun Fang	[1] [2]
4	Yoshiyuki Kawakami	[1] [2]
5	Norio Koike	[1] [2]
6	Zhihong Liu	[1] [2]
7	Yoshifumi Okamoto	[1]
8	Lifeng Wu	[1] [2]
9	Heting Yan	[1]
10	Chune-Sin Yeh	[1] [2]
11	Hirokazu Yonezawa	[1] [2]