| 2005 |
|---|
| 3 | EE | Yong-Chan Ban,
Soo-Han Choi,
Ki-Hung Lee,
Dong-Hyun Kim,
Ji-Suk Hong,
Yoo-Hyon Kim,
Moon-Hyun Yoo,
Jeong-Taek Kong:
A Fast Lithography Verification Framework for Litho-Friendly Layout Design.
ISQED 2005: 169-174 |
| 2002 |
|---|
| 2 | EE | Chul-Hong Park,
Soo-Han Choi,
Sang-Uhk Rhie,
Dong-Hyun Kim,
Jun-Seong Park,
Tae-Hwang Jang,
Ji-Soong Park,
Yoo-Hyon Kim,
Moon-Hyun Yoo,
Jeong-Taek Kong:
A Hybrid PPC Method Based on the Empirical Etch Model for the 0.14µm DRAM Generation and Beyond.
ISQED 2002: 143-147 |
| 2000 |
|---|
| 1 | EE | Ji-Soong Park,
Chul-Hong Park,
Sang-Uhk Rhie,
Yoo-Hyon Kim,
Moon-Hyun Yoo,
Jeong-Taek Kong,
Hyung-Woo Kim,
Sun-Il Yoo:
An Efficient Rule-Based OPC Approach Using a DRC Tool for 0.18mum ASIC.
ISQED 2000: 81-86 |
