2005 | ||
---|---|---|
1 | EE | Yong-Chan Ban, Soo-Han Choi, Ki-Hung Lee, Dong-Hyun Kim, Ji-Suk Hong, Yoo-Hyon Kim, Moon-Hyun Yoo, Jeong-Taek Kong: A Fast Lithography Verification Framework for Litho-Friendly Layout Design. ISQED 2005: 169-174 |
1 | Yong-Chan Ban | [1] |
2 | Soo-Han Choi | [1] |
3 | Dong-Hyun Kim | [1] |
4 | Yoo-Hyon Kim | [1] |
5 | Jeong-Taek Kong | [1] |
6 | Ki-Hung Lee | [1] |
7 | Moon-Hyun Yoo | [1] |