Nash Khouzam

2008
2	EE	Byoungho Kim, Nash Khouzam, Jacob A. Abraham: Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. VTS 2008: 293-298
1995
1		Jean Qincui Xia, Tom Austin, Nash Khouzam: Dynamic Test Emulation for EDA-Based Mixed-Signal Test Development Automation. ITC 1995: 761-770

Coauthor Index

1	Jacob A. Abraham	[2]
2	Tom Austin	[1]
3	Byoungho Kim	[2]
4	Jean Qincui Xia	[1]

Colors in the list of coauthors