| |
| 1986 | ||
|---|---|---|
| 2 | Masato Kawai, T. Shimono, S. Funatsu: Test Data Quality Assurance. ITC 1986: 848-852 | |
| 1985 | ||
| 1 | T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu: An AC/DC Test Generation System for Gate Array LSIs. ITC 1985: 329-333 | |
| 1 | S. Funatsu | [1] [2] |
| 2 | Masato Kawai | [1] [2] |
| 3 | K. Oozeki | [1] |
| 4 | M. Takahashi | [1] |