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1986 | ||
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2 | Masato Kawai, T. Shimono, S. Funatsu: Test Data Quality Assurance. ITC 1986: 848-852 | |
1985 | ||
1 | T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu: An AC/DC Test Generation System for Gate Array LSIs. ITC 1985: 329-333 |
1 | S. Funatsu | [1] [2] |
2 | Masato Kawai | [1] [2] |
3 | K. Oozeki | [1] |
4 | M. Takahashi | [1] |