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T. Shimono

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1986
2 Masato Kawai, T. Shimono, S. Funatsu: Test Data Quality Assurance. ITC 1986: 848-852
1985
1 T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, S. Funatsu: An AC/DC Test Generation System for Gate Array LSIs. ITC 1985: 329-333

Coauthor Index

1S. Funatsu [1] [2]
2Masato Kawai [1] [2]
3K. Oozeki [1]
4M. Takahashi [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)