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K. Ookawa

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1983
1 Masato Kawai, H. Shibano, S. Funatsu, S. Kato, T. Kurobe, K. Ookawa, T. Sasaki: A High Level Test Pattern Generation Algorithm. ITC 1983: 346-353

Coauthor Index

1S. Funatsu [1]
2S. Kato [1]
3Masato Kawai [1]
4T. Kurobe [1]
5T. Sasaki [1]
6H. Shibano [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)