| 2003 |
|---|
| 12 | EE | Wanli Jiang,
Erik Peterson,
Bob Robotka:
Effectiveness Improvement of ECR Tests.
ITC 2003: 699-708 |
| 11 | EE | Wanli Jiang,
Eric Peterson:
Performance Comparison of VLV, ULV, and ECR Tests.
J. Electronic Testing 19(2): 137-147 (2003) |
| 2002 |
|---|
| 10 | EE | Wanli Jiang,
Erik Peterson:
Performance Comparison of VLV, ULV, and ECR Tests.
VTS 2002: 31-36 |
| 9 | EE | Wanli Jiang,
Bapiraju Vinnakota:
Statistical threshold formulation for dynamic Idd test.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(6): 694-705 (2002) |
| 2001 |
|---|
| 8 | | Erik Peterson,
Wanli Jiang:
Practical application of energy consumption ratio test.
ITC 2001: 386-394 |
| 7 | EE | Wanli Jiang,
Bapiraju Vinnakota:
Defect-oriented test scheduling.
IEEE Trans. VLSI Syst. 9(3): 427-438 (2001) |
| 2000 |
|---|
| 6 | EE | Wanli Jiang,
Bapiraju Vinnakota:
IC test using the energy consumption ratio.
IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 129-141 (2000) |
| 1999 |
|---|
| 5 | EE | Wanli Jiang,
Bapiraju Vinnakota:
IC Test Using the Energy Consumption Ratio.
DAC 1999: 976-981 |
| 4 | | Wanli Jiang,
Bapiraju Vinnakota:
Statistical threshold formulation for dynamic I_dd test.
ITC 1999: 57-66 |
| 3 | EE | Wanli Jiang,
Bapiraju Vinnakota:
Defect-Oriented Test Scheduling.
VTS 1999: 433-439 |
| 1998 |
|---|
| 2 | EE | Dechang Sun,
Bapiraju Vinnakota,
Wanli Jiang:
Fast State Verification.
DAC 1998: 619-624 |
| 1 | EE | Bapiraju Vinnakota,
Wanli Jiang,
Dechang Sun:
Process-tolerant test with energy consumption ratio.
ITC 1998: 1027-1036 |
