| 2002 |
|---|
| 4 | EE | John E. Barth Jr.,
Jeffrey Dreibelbis,
Eric A. Nelson,
Darren Anand,
Gary Pomichter,
Peter Jakobsen,
Michael R. Nelms,
Jeffrey Leach,
George M. Belansek:
Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering.
IBM Journal of Research and Development 46(6): 675-690 (2002) |
| 2001 |
|---|
| 3 | | Roderick McConnell,
Rochit Rajsuman,
Eric A. Nelson,
Jeffrey Dreibelbis:
Test and repair of large embedded DRAMs. I.
ITC 2001: 163-172 |
| 2 | | Eric A. Nelson,
Jeffrey Dreibelbis,
Roderick McConnell:
Test and repair of large embedded DRAMs. 2.
ITC 2001: 173-181 |
| 1 | | Herold Pilo,
R. Dean Adams,
Robert E. Busch,
Eric A. Nelson,
Geoerge E. Rudgers:
Bitline contacts in high density SRAMs: design for testability and stressability.
ITC 2001: 776-782 |
