| 2005 |
|---|
| 5 | EE | J. Y. Seo,
K. J. Lee,
Y. S. Kim,
S. Y. Lee,
S. J. Hwang,
C. K. Yoon:
Reliability for Recessed Channel Structure n-MOSFET.
Microelectronics Reliability 45(9-11): 1317-1320 (2005) |
| 4 | EE | J. Y. Seo,
K. J. Lee,
S. Y. Lee,
S. J. Hwang,
C. K. Yoon:
Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics.
Microelectronics Reliability 45(9-11): 1360-1364 (2005) |
| 2002 |
|---|
| 3 | EE | Wen-Ben Jone,
Der-Cheng Huang,
S. C. Wu,
K. J. Lee:
An efficient BIST method for distributed small buffers.
IEEE Trans. VLSI Syst. 10(4): 512-515 (2002) |
| 1999 |
|---|
| 2 | EE | Wen-Ben Jone,
Der-Cheng Huang,
S. C. Wu,
K. J. Lee:
An Efficient BIST Method for Small Buffers.
VTS 1999: 246-251 |
| 1992 |
|---|
| 1 | | Thomas C. Hartrum,
Paul D. Bailor,
J. A. Stewart,
Charles Plinta,
K. J. Lee,
Richard D'Ippolito:
Putting the Engineering into Software Engineering.
CSEE 1992: 287-298 |
