Sheng-Hung Hsieh
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2002
1
EE
Sheng-Hung Hsieh,
Ming-Jun Hsiao
,
Tsin-Yuan Chang
: An Embedded Built-In-Self-Test Approach for Analog-to-Digital Converters.
Asian Test Symposium 2002
: 266-
Coauthor
Index
1
Tsin-Yuan Chang
[
1
]
2
Ming-Jun Hsiao
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)