Terence B. Hook

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6EETerence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz: Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectronics Reliability 45(1): 47-56 (2005)
5EERandy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus: Ultralow-power SRAM technology. IBM Journal of Research and Development 47(5-6): 553-566 (2003)
4EEStephen V. Kosonocky, Michael Immediato, Peter E. Cottrell, Terence B. Hook, Randy W. Mann, Jeff Brown: Enchanced multi-threshold (MTCMOS) circuits using variable well bias. ISLPED 2001: 165-169
3EETerence B. Hook, David Harmon, Chuan Lin: Plasma process-induced damage on thick (6.8 nm) and thin (3.5 nm) gate oxide: parametric shifts, hot-carrier response, and dielectric integrity degradation. Microelectronics Reliability 41(5): 751-765 (2001)
2EETerence B. Hook, Jay S. Burnham, Ronald J. Bolam: Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations. IBM Journal of Research and Development 43(3): 393-406 (1999)
1EETerence B. Hook: Automatic extraction of circuit models from layout artwork for a BiCMOS technology. IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 732-738 (1992)

Coauthor Index

1W. W. (Bill) Abadeer [5]
2Ronald J. Bolam [2] [6]
3Matthew J. Breitwisch [5]
4Jeff Brown [4]
5Jeff S. Brown [5]
6O. Bula [5]
7Jay S. Burnham [2] [6]
8William Clark [6]
9Bryant C. Colwill [5]
10Peter E. Cottrell [4] [5]
11William T. Crocco Jr. [5]
12Stephen S. Furkay [5]
13David Harmon [3]
14Michael J. Hauser [5]
15Dennis Hoyniak [5]
16Michael Immediato [4]
17James M. Johnson [5]
18Stephen V. Kosonocky [4]
19Chung Hon Lam [5]
20Chuan Lin [3]
21Randy W. Mann [4] [5]
22Rebecca D. Mih [5]
23Atsushi Moriwaki [5]
24E. Phipps [5]
25Christopher S. Putnam [5]
26BethAnn Rainey [5]
27J. Rivard [5]
28Nivo Rovedo [6]
29Laura Schutz [6]
30James J. Toomey [5]
31Mohammad Imran Younus [5]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)