W. W. (Bill) Abadeer

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3EEW. W. (Bill) Abadeer: Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides. Microelectronics Reliability 47(2-3): 395-400 (2007)
2EERandy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus: Ultralow-power SRAM technology. IBM Journal of Research and Development 47(5-6): 553-566 (2003)
1EEW. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel: Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM Journal of Research and Development 43(3): 407-416 (1999)

Coauthor Index

1Asmik Bagramian [1]
2Matthew J. Breitwisch [2]
3Jeff S. Brown [2]
4O. Bula [2]
5Bryant C. Colwill [2]
6David W. Conkle [1]
7Peter E. Cottrell [2]
8William T. Crocco Jr. [2]
9Stephen S. Furkay [2]
10Charles W. Griffin [1]
11Michael J. Hauser [2]
12Terence B. Hook [2]
13Dennis Hoyniak [2]
14James M. Johnson [2]
15Chung Hon Lam [2]
16Eric Langlois [1]
17Brian F. Lloyd [1]
18Raymond P. Mallette [1]
19Randy W. Mann [2]
20James E. Massucco [1]
21Jonathan M. McKenna [1]
22Rebecca D. Mih [2]
23Steven W. Mittl [1]
24Atsushi Moriwaki [2]
25Philip H. Noel [1]
26E. Phipps [2]
27Christopher S. Putnam [2]
28BethAnn Rainey [2]
29J. Rivard [2]
30James J. Toomey [2]
31Mohammad Imran Younus [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)