1998 |
11 | EE | Dale E. Hocevar,
Ching-Yu Hung,
Dan Pickens,
Sundararajan Sriram:
Top-Down Design Using Cycle Based Simulation: an MPEG A/V Decoder Example.
Great Lakes Symposium on VLSI 1998: 400- |
1991 |
10 | EE | Paul F. Cox,
Richard Burch,
Dale E. Hocevar,
Ping Yang,
Berton D. Epler:
Direct circuit simulation algorithms for parallel processing [VLSI].
IEEE Trans. on CAD of Integrated Circuits and Systems 10(6): 714-725 (1991) |
1990 |
9 | | Dale E. Hocevar,
Rajeev Arora,
Uttiya Dasgupta,
Sattam Dasgupta,
Nagaraj Subramanyam,
Sham Kashyap:
A Usable Circuit Optimizer for Designers.
ICCAD 1990: 290-293 |
1989 |
8 | EE | Paul F. Cox,
Richard Burch,
Ping Yang,
Dale E. Hocevar:
New implicit integration method for efficient latency exploitation in circuit simulation.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(10): 1051-1064 (1989) |
1988 |
7 | EE | Richard Burch,
Farid N. Najm,
Ping Yang,
Dale E. Hocevar:
Pattern-Independent Current Estimation for Reliability Analysis of CMOS Circuits.
DAC 1988: 294-299 |
6 | EE | Dale E. Hocevar,
Paul F. Cox,
Ping Yang:
Parametric yield optimization for MOS circuit blocks.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(6): 645-658 (1988) |
1987 |
5 | EE | Joseph E. Hall,
Dale E. Hocevar,
Ping Yang,
Michael J. McGraw:
SPIDER -- A CAD System for Modeling VLSI Metallization Patterns.
IEEE Trans. on CAD of Integrated Circuits and Systems 6(6): 1023-1031 (1987) |
1986 |
4 | EE | Ping Yang,
Dale E. Hocevar,
Paul F. Cox,
Charles F. Machala III,
Pallab K. Chatterjee:
An Integrated and Efficient Approach for MOS VLSI Statistical Circuit Design.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(1): 5-14 (1986) |
1985 |
3 | EE | Dale E. Hocevar,
Ping Yang,
Timothy N. Trick,
Berton D. Epler:
Transient Sensitivity Computation for MOSFET Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 4(4): 609-620 (1985) |
1984 |
2 | EE | Dale E. Hocevar,
Michael R. Lightner,
Timothy N. Trick:
An Extrapolated Yield Approximation Technique for Use in Yield Maximization.
IEEE Trans. on CAD of Integrated Circuits and Systems 3(4): 279-287 (1984) |
1983 |
1 | EE | Dale E. Hocevar,
Michael R. Lightner,
Timothy N. Trick:
A Study of Variance Reduction Techniques for Estimating Circuit Yields.
IEEE Trans. on CAD of Integrated Circuits and Systems 2(3): 180-192 (1983) |