J. C. Tsang
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2001
1
J. C. Tsang,
Massimo V. Fischetti
: Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies.
Microelectronics Reliability 41
(9-10): 1465-1470 (2001)
Coauthor
Index
1
Massimo V. Fischetti
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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