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J. C. Tsang

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2001
1 J. C. Tsang, Massimo V. Fischetti: Why hot carrier emission based timing probes will work for 50 nm, 1V CMOS technologies. Microelectronics Reliability 41(9-10): 1465-1470 (2001)

Coauthor Index

1Massimo V. Fischetti [1]

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