| 2006 |
|---|
| 7 | EE | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 46(8): 1217 (2006) |
| 6 | EE | Shivarajiv Somisetty,
Peter Ersland,
Xinxing Yang,
Jason Barrett:
Reliability investigation and characterization of failure modes in Schottky diodes.
Microelectronics Reliability 46(8): 1254-1260 (2006) |
| 2005 |
|---|
| 5 | EE | S. Mil'shtein,
C. Gil,
Peter Ersland:
Heterojunction semiconductor triode - a new vertical device.
Microelectronics Journal 36(3-6): 313-315 (2005) |
| 4 | EE | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 45(12): 1868 (2005) |
| 2004 |
|---|
| 3 | EE | Peter Ersland,
Roberto Menozzi:
Editorial.
Microelectronics Reliability 44(7): 1031 (2004) |
| 2 | EE | Peter Ersland,
Hei-Ruey Jen,
Xinxing Yang:
Lifetime acceleration model for HAST tests of a pHEMT process.
Microelectronics Reliability 44(7): 1039-1045 (2004) |
| 2003 |
|---|
| 1 | EE | S. Mil'shtein,
Peter Ersland,
Shivarajiv Somisetty,
C. Gil:
p-HEMT with tailored field.
Microelectronics Journal 34(5-8): 359-361 (2003) |
