| |
| 2006 | ||
|---|---|---|
| 2 | EE | Shivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason Barrett: Reliability investigation and characterization of failure modes in Schottky diodes. Microelectronics Reliability 46(8): 1254-1260 (2006) |
| 2003 | ||
| 1 | EE | S. Mil'shtein, Peter Ersland, Shivarajiv Somisetty, C. Gil: p-HEMT with tailored field. Microelectronics Journal 34(5-8): 359-361 (2003) |
| 1 | Jason Barrett | [2] |
| 2 | Peter Ersland | [1] [2] |
| 3 | C. Gil | [1] |
| 4 | S. Mil'shtein | [1] |
| 5 | Xinxing Yang | [2] |