Hei-Ruey Jen
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2004
1
EE
Peter Ersland
, Hei-Ruey Jen,
Xinxing Yang
: Lifetime acceleration model for HAST tests of a pHEMT process.
Microelectronics Reliability 44
(7): 1039-1045 (2004)
Coauthor
Index
1
Peter Ersland
[
1
]
2
Xinxing Yang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
